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HIOKI DC HIPOT TESTER ST5680A
Bring Waveform Intelligence to Safety Testing.
Accelerate EV Battery Quality with DC Hipot Analysis.
Bring Waveform Intelligence to Safety Testing.
Accelerate EV Battery Quality with DC Hipot Analysis.
Global Compliance & Unified Test Platforms
Standardize DC hipot testing across global EV battery sites with one platform.
- CE, UKCA, and CSA (NRTL) certifications for worldwide use
- Up to 8 kV/20 mA to satisfy standard‑defined DC withstand voltage tests
- Easier global standardization of test recipes, criteria, and procedures
Built‑in Contact Check for Quality Improvement & Design Cost Reduction
Detect poor probing without external continuity hardware or complex sequences.
- Capacitance‑based contact check built into the tester
- Detects degradation or disconnection of jigs, leads, and high‑voltage relays
- Reduces risk of false PASS due to poor contact on high‑value modules/packs
- Simplifies wiring and PLC design, shortening line start‑up and debug time
Basic Specifications
Accuracy guaranteed: 1 year
For detailed measurement accuracy, temperature coefficients, and I/O signal assignments, refer to the instruction manual and brochure.
For detailed measurement accuracy, temperature coefficients, and I/O signal assignments, refer to the instruction manual and brochure.
| Main functions | DC hipot test, Insulation resistance test, Breakdown voltage (BDV) test, Waveform display function, Arc detection, Contact check function |
|---|---|
| Operating temperature and humidity range | 0°C to 40°C (32°F to 104°F), 80% RH or less (non-condensing) |
| Standards | Safety: IEC 61010 EMC: EN 61326 |
| Power supply | 100 V to 240 V AC, 50 Hz/60 Hz |
| Power consumption | Approx. 180 VA (220 V, DC hipot test mode, 2.5 kV, 5 mA load current) |
| Maximum rated power | 800 VA |
| Interface | USB, LAN, EXT. I/O Optional: RS-232C (Z3001), GP-IB (Z3000) Memory: USB drive |
| Dimensions and mass | Approx. 305 mm (12.01 in.) W × 142 mm (5.59 in.) H × 430 mm (16.93 in.) D (excluding protrusions) Approx. 10.4 kg (366.8 oz.) |
| Included accessories | Power cord ×1, EXT. I/O male connector ×1, EXT. I/O connector cover ×1, Interlock-canceling jig for EXT. I/O ×1, Startup Guide ×1, Operating Precautions (0990A903) ×1 |
Various Tests and Functionality
| DC hipot test | • Output voltage: 0.010 kV DC to 8.000 kV (1 V resolution) • Output setting accuracy: ±20 V (below 3 kV, no load), ±0.4 % of setting ±8 V (3 kV and above, no load) • Output/cutoff current: Max. 20 mA (test voltage 50 V or higher) • Current accuracy: ±1.5% rdg. (typ., see instruction manual or brochure for details) • Minimum resolution: 0.001 µA • Test time: 0.1 s to 999 s, continuous (timer OFF) • Voltage rise/fall time: 0.1 s to 300 s / 0.1 s to 300 s, OFF • Test modes: W to IR, IR to W, Program test |
|---|---|
| Insulation resistance test | • Output voltage: 10 V DC to 2000 V (1 V resolution) • Output setting accuracy: ±20 V (no load) • Resistance display range: 100.0 kΩ to 200.0 GΩ (0.01 kΩ resolution) • Accuracy guarantee range: 100.0 kΩ to 99.99 GΩ • Resistance accuracy: ±1.5% rdg. (see instruction manual or brochure for detailed range‑wise accuracy) • Test time: 0.1 s to 999 s, continuous (timer OFF) • Voltage rise/fall time: 0.1 s to 300 s / 0.1 s to 300 s, OFF |
| Breakdown voltage (BDV) test | • Test methods: Continuous voltage rise test, Stepped voltage rise test • Measurement: Insulation breakdown voltage (kV), Insulation breakdown strength (kV/mm) • Settings: Start voltage, End voltage, Rise speed, Arc detection, Electrode distance, Upper limit current |
| Waveform display function | • Waveforms: Voltage, Current, Insulation resistance • Sampling rate: Max. 500 kS/s • Display length: 0.5 s to 128 s (9 steps) • Memory capacity: 512 k words |
| Arc detection | • Detection method: Monitoring of test‑voltage fluctuations • Setting range: Test‑voltage variability 1% to 50% |
| Contact check function | • Detection method: Capacitance‑measurement method • Setting range: Threshold (capacitance) setting 1.0 nF to 100.0 nF |
| Memory functions | • Waveform / graph save: Destination: USB memory Formats: BMP, PNG, CSV • Panel memory: DC hipot/IR: up to 64 sets each BDV test: up to 10 sets Program test: up to 30 programs (max. 50 steps) • Data memory: Up to 32,000 measured values |
| Judgment functions | • PASS, FAIL (UPPER FAIL, LOWER FAIL) • Judgment output via EXT. I/O and communication |
| Safety and usability functions | • Interlock: links output enable/disable with external safety devices • Automatic discharge: internal discharge after testing (residual voltage 30 V or less) • Voltage limitation:upper‑limit control from 0.010 kV to 8.000 kV • Auto range: automatic range switching based on measured values • Panel memories: store and recall test conditions • Self‑check/Key lock/Command monitor/I/O HANDLER test |
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